Prof. Dr. Andreas Mandelis

Profile

Academic positionFull Professor
Research fieldsSemiconductor Physics,Medical Physics, Biomedical Engineering
KeywordsPhotothermik, Thermische Wellen, Halbleiter, Biomedizin, Zerstörungsfreie Diagnostik

Current contact address

CountryCanada
CityToronto
InstitutionUniversity of Toronto
InstituteDepartment of Mechanical and Industrial Engineering

Host during sponsorship

Prof. Dr. Josef PelzlInstitut für Experimentalphysik III - Physik mit Ionenstrahlen, Ruhr-Universität Bochum, Bochum
Prof. Dr. Vasilis NtziachristosInstitut für Biologische und Medizinische Bildgebung, Helmholtz Zentrum München, Deutsches Forschungszentrum für Gesundheit und Umwelt (GmbH), Oberschleißheim
Prof. Dr. Vasilis NtziachristosInstitute for Biological and Medical Imaging (IBMI), Technische Universität München, Oberschleißheim
Start of initial sponsorship01/10/2003

Programme(s)

2001Humboldt Research Award Programme

Publications (partial selection)

2007C.-H. Wang A. Mandelis, J. Tolev, B. Burchard and J. Meijer: H+ ion-implantation energy dependence of electronic transport properties in the MeV range in n-type silicon wafers using frequency-domain photocarrier radiometry. In: Journal of Applied Physics, 2007, 123109-1-123109-11
2007Jordan Tolev, Andreas Mandelis and Michal Pawlak: Nonlinear Dependence of Photocarrier Radiometry Signals from p-Si Wafers on Optical Excitation Intensity. In: Journal of the Electrochemical Society, 2007, H983-H994
2005Andreas Mandelis, Jerias Batista, Juergen Gibkes, Michael Pawlak and Josef Pelzl: Noncontacting laser photocarrier radiometric depth profilometry of harmonically modulated band bending in the space-charge layer at doped SiO2-Si interfaces. In: journal of applied physics, 2005, 083507-1-083507-11
2005Andreas Mandelis: Theory of space-charge layer dynamics at oxide-semiconductor interfaces under optical modulation and detection by laser photocarrier radiometry. In: journal of applied physics, 2005, 083508-1-083508-11
2005Andreas Mandelis, Micha Pawlak, Chinhua Wang, Isabel Delgadillo-Holtfort, and Josef Pelzl: Time-domain and lock-in rate-window photocarrier radiometric measurements of recombination processes in silicon . In: Journal of Applied Physics, 2005, 123518-1-123518-13
2004A. Mandelis, M. Pawlak and D. Shaughnessy: Carrier-Density-Wave Transport and Local Internal Electric Field Measurements in Biased Metal-Oxide-Semiconductor n-Si Devices using Contactless Laser Photo-Carrier Radiometry. In: Semiconductor Science and Technology, 2004, 1240-1249